Radiation-Induced Variable Retention Time in Dynamic Random Access Memories
نویسندگان
چکیده
منابع مشابه
Testing Static and Dynamic Faults in Random Access Memories
The ever increasing trend to reduce DPM levels of memories requires tests with very high fault coverages. The very important class of dynamic fault, therefore cannot be ignored any more. It will be shown in this paper that conventional memory tests constructed to detect the static faulty behavior of a specific defect do not necessarily detect its dynamic faulty behavior; which has been shown to...
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ژورنال
عنوان ژورنال: IEEE Transactions on Nuclear Science
سال: 2020
ISSN: 0018-9499,1558-1578
DOI: 10.1109/tns.2019.2956293